Probe Station (MI-WPT2)
Features:
• Optimized for I-V, C-V measurements of device and wafer characterization tests, Failure analysis, sub- micro probing MEMS, optoelectronics engineering test and more.
• Stable Platen mounted with up to 6 micro positioners facility.
• Solid station frame with built-in vibration-isolations.
• Option for High Resolution top side microscope.
• Quick and ergonomic sample change.
Description
Package Include:
• XY Theta Chuck : 1 Nos.
• Micro positioners : 4Nos.
• Microscope : Stereo Zoom , Microscope System With Boom Stand(1Nos)
• Probe Type RF Coaxial : 4 Nos.
• Magnetic Steel Platen : 2 Nos.
• Probe Tips : 4Nos+ 6Nos spare Needle
